![Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry | Scientific Reports Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry | Scientific Reports](https://media.springernature.com/m685/springer-static/image/art%3A10.1038%2Fsrep24703/MediaObjects/41598_2016_Article_BFsrep24703_Fig1_HTML.jpg)
Three-Dimensional Super-Resolution Morphology by Near-Field Assisted White-Light Interferometry | Scientific Reports
![PDF] Measurement Uncertainty of White-Light Interferometry on Optically Rough Surfaces | Semantic Scholar PDF] Measurement Uncertainty of White-Light Interferometry on Optically Rough Surfaces | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/12800abc248d04a8c90ff0e8f8c84c64a436b8a8/2-Figure1-1.png)
PDF] Measurement Uncertainty of White-Light Interferometry on Optically Rough Surfaces | Semantic Scholar
![Machines | Free Full-Text | Measurement of Film Structure Using Time-Frequency-Domain Fitting and White-Light Scanning Interferometry Machines | Free Full-Text | Measurement of Film Structure Using Time-Frequency-Domain Fitting and White-Light Scanning Interferometry](https://www.mdpi.com/machines/machines-09-00336/article_deploy/html/images/machines-09-00336-g001.png)
Machines | Free Full-Text | Measurement of Film Structure Using Time-Frequency-Domain Fitting and White-Light Scanning Interferometry
![Scanning White-Light Interferometry Fingerprints the Polishing Process | Features | Jul 2013 | Photonics Spectra Scanning White-Light Interferometry Fingerprints the Polishing Process | Features | Jul 2013 | Photonics Spectra](https://www.photonics.com/images/Web/Articles/2013/7/1/Light_Figure1.jpg)
Scanning White-Light Interferometry Fingerprints the Polishing Process | Features | Jul 2013 | Photonics Spectra
![A rapid measurement method for structured surface in white light interferometry - LEI - 2019 - Journal of Microscopy - Wiley Online Library A rapid measurement method for structured surface in white light interferometry - LEI - 2019 - Journal of Microscopy - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/0f61b92a-3bd6-4bf6-86ee-6528fb1bcb71/jmi12843-fig-0010-m.jpg)
A rapid measurement method for structured surface in white light interferometry - LEI - 2019 - Journal of Microscopy - Wiley Online Library
![PDF] White Light Interferometry - a production worthy technique for measuring surface roughness on semiconductor wafers | Semantic Scholar PDF] White Light Interferometry - a production worthy technique for measuring surface roughness on semiconductor wafers | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/c3d389f7339666855107478ef0168de6ed8215a9/3-Figure3-1.png)
PDF] White Light Interferometry - a production worthy technique for measuring surface roughness on semiconductor wafers | Semantic Scholar
![Sensors | Free Full-Text | A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI) Sensors | Free Full-Text | A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI)](https://www.mdpi.com/sensors/sensors-20-05225/article_deploy/html/images/sensors-20-05225-g001.png)
Sensors | Free Full-Text | A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI)
![White Light Interferometers | Instruments Used For Roughness Measurements | Introduction To Roughness | KEYENCE America White Light Interferometers | Instruments Used For Roughness Measurements | Introduction To Roughness | KEYENCE America](https://www.keyence.com/Images/ss_microscope_roughness_equipment_s_ph02_1578272.jpg)
White Light Interferometers | Instruments Used For Roughness Measurements | Introduction To Roughness | KEYENCE America
![White Light Interferometry for Highly Accurate Thickness Measurements | Features | Sep 2018 | Photonics Spectra White Light Interferometry for Highly Accurate Thickness Measurements | Features | Sep 2018 | Photonics Spectra](https://www.photonics.com/images/Web/Articles/2018/8/1/Interferometry_SeptPS18_2.jpg)
White Light Interferometry for Highly Accurate Thickness Measurements | Features | Sep 2018 | Photonics Spectra
![White light interferometers, explained by RP Photonics Encyclopedia; applications, chromatic dispersion measurement, distance, low-coherence interferometry White light interferometers, explained by RP Photonics Encyclopedia; applications, chromatic dispersion measurement, distance, low-coherence interferometry](https://www.rp-photonics.com/img/wli_signal.png)